Computer vision (CV) and image processing are two closely related fields that utilize techniques from artificial intelligence (AI) and pattern recognition to derive meaningful information from images, ...

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

Researchers at the Georgia Tech Research Institute recently combined machine learning, field-programmable gate arrays (FPGAs), graphics processing units (GPUs), and a novel radio frequency image ...

In a relatively low-light scenario with tricky colors, the Motorola flagship surprisingly handled both the subject and the background better than the rest.

Technology is continuously advancing and exponentially increasing the amount of data produced. Data comes from a multitude of sources and formats, requiring systems to process different algorithms.